Three-dimensional profile measurement of small lens using subpixel localization with color grating-Reference-Cited by-同舟云学术

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Three-dimensional profile measurement of small lens using subpixel localization with color grating

Published:2010-12 Issue:23 Volume:121 Page:2122-2127
ISSN:0030-4026
Container-title:Optik
language:en
Short-container-title:Optik

Author:

Lin Chern-Sheng,Lin Chia-Hau,Lin Chi-Chin,Yeh Mau-Shiun

Funder

National Science Council

Chung-Shan Institute of Science and Technology

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference15 articles.

1. Fringe-pattern demodulation using an iterative linear digital phase locked loop algorithm;Gdeisat;Opt. Lasers Eng.,2005

2. Shape measurement using one frame projected sawtooth fringe pattern;Chen;Opt. Commun.,2005

3. A three-dimensional automated visual inspection system for SMT assembly;Guerra;Comput. Ind. Eng.,2001

4. Image acquisition techniques for automatic visual inspection of metallic surfaces;Pernkopf;NDT&E Int.,2003

5. A new algorithm for large surfaces profiling by fringe projection;Pavageau;Sensors Actuators: A Phys.,2004

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2. Automatic defect recognition of TFT array process using gray level co-occurrence matrix;Optik;2014-06

3. Automatic optical inspection system for 3D surface profile measurement of multi-microlenses using the optimal inspection path;Measurement Science and Technology;2014-05-23

4. Lens sag and diameter measurement of large-size microlenses using sub-pixel algorithm and optical interferometry;Optics & Laser Technology;2014-04

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