Subsurface quality of polished SiO2 surface evaluated by quasi-Brewster angle technique-Reference-Cited by-同舟云学术

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Subsurface quality of polished SiO2 surface evaluated by quasi-Brewster angle technique

Published:2011-08 Issue:16 Volume:122 Page:1418-1422
ISSN:0030-4026
Container-title:Optik
language:en
Short-container-title:Optik

Author:

Ma Bin,Shen Zhengxiang,He Pengfei,Ji Yiqin,Sang Tian,Jiao Hongfei,Liu Huasong,Liu Dandan,Zhai Zirong,Wang Zhanshan

Funder

National Natural Science Foundation of China

Shanghai Committee of Science and Technology, China

Shanghai Planned Projects for Postdoctoral Research Funds

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference21 articles.

1. Subsurface damage in some single crystalline optical materials;Randi;Appl. Opt.,2005

2. Optical Glass;Izumitani,1986

3. Transition between brittle and ductile mode in loose abrasive grinding;Golini;Proc. SPIE,1990

4. Phase transformations of silicon caused by contact loading;Kailer;J. Appl. Phys.,1997

5. Parametric study of the growth of damage sites on the rear surface of fused silica windows;Razé;Proc. SPIE,2003

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2. Evaluation of the surface and subsurface evolution of single-crystal yttrium aluminum garnet during polishing;Applied Surface Science;2023-01

3. Surface and Subsurface Quality Assessment of Polished Lu2O3 Single Crystal Using Quasi-Brewster Angle Technique;Frontiers in Physics;2021-12-20

4. Assessing the quality of polished brittle optical crystal using quasi-Brewster angle technique;Precision Engineering;2021-11

5. Three-dimensional evaluation of subsurface damage in optical glasses with ground and polished surfaces using FF-OCT;Applied Optics;2021-03-02

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