Based on the refractive angle method of complex refractive index measurement-Reference-Cited by-同舟云学术

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Based on the refractive angle method of complex refractive index measurement

Published:2018-12 Issue: Volume:174 Page:692-697
ISSN:0030-4026
Container-title:Optik
language:en
Short-container-title:Optik

Author:

Zhang Qiuzhang,Luo Tianshu

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference16 articles.

1. M. Born, E. Wolf (X.S. Yang Trans.), Principles of Optics, 5th Edition, (Science press: Beijing), 1978, 619–623.

2. Model building and optimization of ultrathin silver films by spectroscopic ellipsometry;Cao;Spectrosc. Spectral Anal.,2008

3. High precision automatic ellipsometer;Zhu;J. Zhongshan Univ. (Nat. Sci.),1997

4. R.M.A. Azzam, N.M. Bashara (Min-ji Liang Trans.), et al., Ellipsometry and polarized light. Science Press: Beijing, 1986, 179.

5. Study on precision of spectroscopic-ellipsometry-measured optical constant of Au film;Feng;J. Infrared Millimter Waves,1993

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