Thickness dependence of infrared reflectance of ultrathin metallic films: Influence of quantum confinement-Reference-Cited by-同舟云学术

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Thickness dependence of infrared reflectance of ultrathin metallic films: Influence of quantum confinement

Published:2016-08 Issue:15 Volume:127 Page:5920-5927
ISSN:0030-4026
Container-title:Optik
language:en
Short-container-title:Optik

Author:

Villagómez Ricardo,Xiao Mufei

Funder

PAPIIT-UNAM

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference14 articles.

1. Transparent conductors as solar energy materials: a panoramic review;Granqvist;Sol. Energy Mater. Sol. Cells,2007

2. Ultrathin metal films as an alternative to TCOs for optoelectronic applications;Giurgola;Il Nuovo Cimento B,2007

3. Ultra thin nickel transparent electrodes;Giurgola;J. Mater. Sci. Mater. Electron.,2009

4. Optical properties of nickel thin films deposited by electroless plating;Dumont;Thin Solid Films,1997

5. Quantum size effect on ultra-thin metallic films;Su;J. Phys. D: Appl. Phys.,2010

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