A practical evaluation method of microwave noise parameters using wide-band frequency-variation measurements
Author:
Funder
DGRSDT Science Foundation of Algeria
Publisher
Elsevier BV
Subject
Electrical and Electronic Engineering,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference14 articles.
1. Interpreting transistor noise;Pospieszalski;IEEE Microw. Mag.,2010
2. Broadband noise system allows measurements according to both standard methods;Meys;IEEE Trans. Instrum. Meas.,2011
3. Noise parameters computation of microwave devices using genetic algorithms;Chen;IEICE Trans. Electron.,2005
4. Improved Y-factor method for wide-band on-wafer noise-parameter measurements;Tiemeijer;IEEE Trans. Microw. Theory Tech.,2005
5. A novel wide-band noise-parameter measurement method and its cryogenic application;Hu;IEEE Trans. Microw. Theory Tech.,2004
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