Surface profile inspection of a moving object by using dual-frequency Fourier transform profilometry
Author:
Publisher
Elsevier BV
Subject
Electrical and Electronic Engineering,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference12 articles.
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4. Phase deviation analysis and phase retrieval for partial intensity saturation in phase-shifting projected fringe profilometry;Chen;Opt. Commun.,2008
5. Fourier transform profilometry for the automatic measurement of 3-D object shapes;Takeda;Appl. Opt.,1983
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