Monitoring micro-mechanical changes in electronic circuit boards with digital holographic interferometry
Author:
Publisher
Elsevier BV
Subject
Electrical and Electronic Engineering,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference17 articles.
1. Introduction to Nondestructive Testing: A Training Guide;Mix,2005
2. Practical Non Destructive Testing;Raj,2002
3. Nondestructive Testing;Cartz,1995
4. Optical Shop Testing;Birch,2007
5. Holography in Optical Metrology;Gåsvik,2003
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