Research on an imaging spectropolarimeter-Reference-Cited by-同舟云学术

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Research on an imaging spectropolarimeter

Published:2018-05 Issue: Volume:160 Page:214-217
ISSN:0030-4026
Container-title:Optik
language:en
Short-container-title:Optik

Author:

Lin Xuling,Zhao Haibo,Wang Zheng

Funder

National Natural Science Foundation of China

Program of National Natural Science Foundation of China

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference11 articles.

1. Polarimetric-spectral intensity modulation (P-SIM): enabling simultaneous hyperspectral and polarimetric imaging;Innarilli;Proc. SPIE,1999

2. Imaging spectropolarimeters for use in visible and infrared remote sensing;Tyo;Proc. SPIE,1999

3. Design and performance of a compact, miniature static Fourier transform imaging spectropolarimeter;Li;Proc. SPIE,2011

4. Recent progress in thin film growth analysis by multichannel spectroscopic ellipsometry;Collins;Appl. Surf. Sci.,2000

5. Analysis of semiconductor materials and structures by spectroellipsometry;Aspnes;Proc. SPIE,1988

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