Low voltage and variable-pressure scanning electron microscopy of fractured composites-Reference-Cited by-同舟云学术

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Low voltage and variable-pressure scanning electron microscopy of fractured composites

Published:2012-10 Issue:10 Volume:43 Page:1039-1049
ISSN:0968-4328
Container-title:Micron
language:en
Short-container-title:Micron

Author:

Hein Luis Rogerio de Oliveira,Campos Kamila Amato de,Caltabiano Pietro Carelli Reis de Oliveira

Publisher

Elsevier BV

Subject

Cell Biology,Structural Biology,General Physics and Astronomy,General Materials Science

Reference35 articles.

1. The effect of beam diameter on the electron skirt in a high pressure scanning electron microscope;Belkorissat;Micron,2004

2. Electron distribution on a tilted sample in high pressure SEM;Belkorissat;Micron,2005

3. Consequences of positive ions upon imaging in low vacuum scanning electron microscopy;Craven;Journal of Microscopy,2002

4. Foundations of environmental scanning electron microscopy;Danilatos,1988

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1. Fractographic analysis of scarf repaired carbon/epoxy laminates submitted to tensile strength;Engineering Failure Analysis;2021-06

2. 3-D reconstruction by extended depth-of-field in tribological analysis: Fractal approach of sliding surface in Polyamide66 with glass fiber reinforcement;Polymer Testing;2019-02

3. Determining E 1 and E 2 values for yttrium aluminum garnet ceramics using the Duane‐Hunt limit;Microscopy Research and Technique;2018-10

4. Correlative Light-Electron Fractography of Interlaminar Fracture in a Carbon–Epoxy Composite;Microscopy and Microanalysis;2015-10-30

5. Resolving topography of an electron beam-sensitive oxalate-phosphate-amine metal–organic framework (OPA-MOF);Journal of Materials Science;2015-10-15

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