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Damage behavior and atomic migration in MgAl 2 O 4 under an 80 keV scanning focused probe in a STEM

  • Published:2015-01 Issue: Volume:68 Page:141-145
  • ISSN:0968-4328
  • Container-title:Micron
  • language:en
  • Short-container-title:Micron

Author:

Zhu Guo-zhen,Botton Gianluigi A.

Funder

NSERC

Publisher

Elsevier BV

Subject

Cell Biology,Structural Biology,General Physics and Astronomy,General Materials Science

Reference22 articles.

1. Electron irradiation damage in oxides;Buckett;Ultramicroscopy,1989

2. Structural damage in MgAl2O4 spinel after high dose electron irradiation at elevated temperatures;Buckley;J. Nucl. Mater.,1986

3. Visibility of single atoms;Crewe;Science,1970

4. Radiation damage in the TEM and SEM;Egerton;Micron (Oxf., Engl.: 1993),2004

5. Electron Energy-Loss Spectroscopy in the Electron Microscope;Egerton,2011

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1. Interstitial defects in the van der Waals gap of Bi2Se3;Acta Crystallographica Section B Structural Science, Crystal Engineering and Materials;2019-07-23

2. Influence of strain rate effect on material removal and deformation mechanism based on ductile nanoscratch tests of Lu2O3 single crystal;Ceramics International;2018-12

3. Temperature-Induced Atomic Reconstruction At Au/MgAl2 O4 Interfaces;Advanced Materials Interfaces;2018-03-23

4. Twin-assisted growth of nominally stable substrates underneath dewetted Au nanoparticles;Materials Characterization;2016-03

5. Electron beam damage in oxides: a review;Reports on Progress in Physics;2015-12-18
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