Optimized FIB silicon samples suitable for lattice parameters measurements by convergent beam electron diffraction-Reference-Cited by-同舟云学术

Optimized FIB silicon samples suitable for lattice parameters measurements by convergent beam electron diffraction

Published:2008-04 Issue:3 Volume:39 Page:294-301
ISSN:0968-4328
Container-title:Micron
language:en
Short-container-title:Micron

Author:

Alexandre L.,Rousseau K.,Alfonso C.,Saikaly W.,Fares L.,Grosjean C.,Charaï A.

Publisher

Elsevier BV

Subject

Cell Biology,Structural Biology,General Physics and Astronomy,General Materials Science

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