Electron backscattering diffraction and X-ray diffraction studies of interface relationships in Sr3Ru2O7/Sr2RuO4 eutectic crystals-Reference-Cited by-同舟云学术

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Electron backscattering diffraction and X-ray diffraction studies of interface relationships in Sr3Ru2O7/Sr2RuO4 eutectic crystals

Published:2011-06 Issue:4 Volume:42 Page:324-329
ISSN:0968-4328
Container-title:Micron
language:en
Short-container-title:Micron

Author:

Ciancio R.,Pettersson H.,Fittipaldi R.,Kalabukhov A.,Orgiani P.,Vecchione A.,Maeno Y.,Pace S.,Olsson E.

Publisher

Elsevier BV

Subject

Cell Biology,Structural Biology,General Physics and Astronomy,General Materials Science

Reference25 articles.

1. Transport properties, thermodynamic properties, and electronic structure ofSrRuO3

2. An Introduction to Modern Texture Analysis;Bunge,1985

3. Thermal, magnetic, and transport properties of single-crystalSr1−xCaxRuO3(0<~x<~1.0)

4. From antiferromagnetic insulator to ferromagnetic metal: a brief review of the layered ruthenates

5. Competing ground states in triple-layeredSr4Ru3O10:Verging on itinerant ferromagnetism with critical fluctuations

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1. Fabrication of superconducting Nd2−xCexCuO4±δ films by automated dc sputtering technique;Physica C: Superconductivity;2013-12

2. Comparative study of initial stages of copper immersion deposition on bulk and porous silicon;Nanoscale Research Letters;2013-02-15

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