Fully-automatic defects classification and restoration for STM images-Reference-Cited by-同舟云学术

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Fully-automatic defects classification and restoration for STM images

Published:2020-03 Issue: Volume:130 Page:102798
ISSN:0968-4328
Container-title:Micron
language:en
Short-container-title:Micron

Author:

Fan Xian-guang,Wu Yi,Zhi Yu-Liang,Xia Hong,Wang Xin

Funder

ational Nature Science Foundation of China

tate Key Laboratory of Physical Chemistry of Solid Surfaces, Xiamen University

Publisher

Elsevier BV

Subject

Cell Biology,Structural Biology,General Physics and Astronomy,General Materials Science

Reference27 articles.

1. Scanning tunneling microscopy-from birth to adolescence;Binnig;Rev. Mod. Phys.,1987

2. (111) facets as the origin of reconstructed Au(110) surfaces;Binnig;Surf. Sci.,1983

3. Scanning tunneling microscopy;Binnig;Surf. Sci.,1983

4. Learning multi-label scene classification;Boutell;Pattern Recognit.,2004

5. On the applications of robust PCA in image and video processing;Bouwmans;Proc. IEEE,2018

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3. Analysis of the elemental effects on the surface potential of aluminum alloy using machine learning;Japanese Journal of Applied Physics;2022-06-14

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