Enhanced detection of nanostructures by scanning electron microscopy using insulating materials-Reference-Cited by-同舟云学术

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Enhanced detection of nanostructures by scanning electron microscopy using insulating materials

Published:2013-09 Issue: Volume:52-53 Page:57-61
ISSN:0968-4328
Container-title:Micron
language:en
Short-container-title:Micron

Author:

O'Shea Aaron,Wallace Jeff,Hummel Matt,Strauss Laura H.,Kidd Timothy E.

Publisher

Elsevier BV

Subject

Cell Biology,Structural Biology,General Physics and Astronomy,General Materials Science

Reference17 articles.

1. Mechanical and electrical properties of nanotubes;Bernholc;Annual Review of Materials Research,2002

2. Surface studies by scanning tunneling microscopy;Binnig;Physical Review Letters,1982

3. Rapid imaging of nanotubes on insulating substrates;Brintlinger;Applied Physics Letters,2002

4. Charging phenomena in the scanning electron microscopy of conductor–insulator composites: a tool for composite structural analysis;Chung;Journal of Applied Physics,1983

5. Carbon nanotube inter- and intramolecular logic gates;Derycke;Nano Letters,2001

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Advanced Characterisation Techniques for Nanostructures;Micro and Nanomanufacturing Volume II;2017-10-29

2. Enhancing image contrast of carbon nanotubes on cellular background using helium ion microscope by varying helium ion fluence;Journal of Microscopy;2017-07-13

3. Leakage current characteristics of the insulating sample under high-energy electron irradiation;Acta Physica Sinica;2014

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