Origin of spurious intensity in vacuum near sample edge in bright field TEM images-Reference-Cited by-同舟云学术

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Origin of spurious intensity in vacuum near sample edge in bright field TEM images

Published:2022-11 Issue: Volume:162 Page:103348
ISSN:0968-4328
Container-title:Micron
language:en
Short-container-title:Micron

Author:

Hayashida Misa,Malac Marek,Yamasaki Jun

Funder

Ministry of Education, Culture, Sports, Science and Technology

Natural Sciences and Engineering Research Council of Canada

National Research Council Canada

Publisher

Elsevier BV

Subject

Cell Biology,Structural Biology,General Physics and Astronomy,General Materials Science

Reference16 articles.

1. Nanoparticle movement: plasmonic forces and physical constraints;Batson;Ultramicroscopy,2012

2. Vibrational-loss eels and the avoidance of radiation damage;Egerton;Ultramicroscopy,2015

3. Egerton, R.F., 2011. Electron Energy Loss Spectroscopy in Electron Microscope.

4. Practical electron tomography guide: recent progress and future opportunities;Hayashida;Micron,2016

5. High-energy electron scattering in thick samples evaluated by bright field transmission electron microscopy, energy-filtering transmission electron microscopy and electron tomography;Hayashida;Microsc. Microanal.,2022

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