The effect of probe inaccuracies on the quantitative model-based analysis of high angle annular dark field scanning transmission electron microscopy images-Reference-Cited by-同舟云学术

The effect of probe inaccuracies on the quantitative model-based analysis of high angle annular dark field scanning transmission electron microscopy images

Published:2014-08 Issue: Volume:63 Page:57-63
ISSN:0968-4328
Container-title:Micron
language:en
Short-container-title:Micron

Author:

Martinez G.T.,De Backer A.,Rosenauer A.,Verbeeck J.,Van Aert S.

Funder

European Research Council

Publisher

Elsevier BV

Subject

Cell Biology,Structural Biology,General Physics and Astronomy,General Materials Science

Reference30 articles.

1. Three-dimensional atomic imaging of colloidal core–shell nanocrystals;Bals;Nanoletters,2011

2. Atomic scale dynamics of ultrasmall germanium clusters;Bals;Nature Communications,2012

3. Aberration measurement in HRTEM: implementation and diagnostic use of numerical procedures for highly precise recognition of diffractogram patterns;Barthel;Ultramicroscopy,2010

4. Characterizing probe performance in the aberration corrected stem;Batson;Ultramicroscopy,2006

5. Principles of Optics-Electromagnetic Theory of Propagation, Interference and Diffraction of Light;Born,1998

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