Surface topographic study of chalcogenide thin films of GexSb(As)40−xS50Te10 glasses

Author:

Anastasescu M.,Gartner M.,Szekeres A.,Pamukchieva V.

Publisher

Elsevier BV

Subject

Cell Biology,Structural Biology,General Physics and Astronomy,General Materials Science

Reference17 articles.

1. Chalcogenide thin films deposited by radio-frequency sputtering;Balan;J. Optoelectron. Adv. Mater.,2004

2. Surface topography and optical properties of Ge–Sb(As)–S–Te thin films by atomic-force microscopy and variable angle spectroscopic ellipsometry;Dulgheru (Nedelcu);J. Phys.: Conf. Ser.,2012

3. X-ray photoelectron spectroscopy studies of thin GexSb40−xS60 chalcogenide films;Jiang;J. Non-Cryst. Solids,2002

4. All-chalcogenide glass omnidirectional photonic band gap variable infrared filters;Kondakci;Appl. Phys. Lett.,2009

5. Concentration dependence of radiation-induced changes in the optical properties of GexAs40−xS60 films;Maslyuk;Phys. Solid State,2004

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