Vertical distance from shading in the SEM-Reference-Cited by-同舟云学术

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Vertical distance from shading in the SEM

Published:2021-02 Issue: Volume:141 Page:102978
ISSN:0968-4328
Container-title:Micron
language:en
Short-container-title:Micron

Author:

Gao Peng^ORCID,Zhou Jie,Rong Weibin,Gao Jian,Wang Lefeng,Sun Lining

Funder

Foundation for Innovative Research Groups of the National Natural Science Foundation of China

Self-Planned Task of the State Key Laboratory of Robotics and System

Publisher

Elsevier BV

Subject

Cell Biology,Structural Biology,General Physics and Astronomy,General Materials Science

Reference31 articles.

1. Acquisition of 3D models with submillimeter-sized features from SEM images by use of photogrammetry: a dimensional comparison to microtomography;Barbieri;Micron,2019

2. Learning OpenCV - Computer Vision With the OpenCV Library: Software That Sees;Bradski,2008

3. Advanced detector signal acquisition and electron beam scanning for high resolution SEM imaging;C., L.W;Ultramicroscopy,2018

4. Three-dimensional electron microscopy simulation with the CASINO Monte Carlo software;Demers;Scanning,2011

5. Automatic 3D reconstruction of SEM images based on nano-robotic manipulation and epipolar plane images;Ding;Ultramicroscopy,2019

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1. 3D-measurement of particles and particulate assemblies - A review of the paradigm shift in describing anisotropic particles;Powder Technology;2024-11

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