Developments in Imaging and Analysis Techniques for Micro- and Nanosize Particles and Surface Features-Reference-Cited by-同舟云学术

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Developments in Imaging and Analysis Techniques for Micro- and Nanosize Particles and Surface Features

Published:2012 Issue: Volume: Page:215-306
ISSN:
Container-title:Developments in Surface Contamination and Cleaning
language:
Short-container-title:

Author:

Kohli Rajiv

Publisher

Elsevier

Reference423 articles.

1. Executive Summary;International Technology Roadmap for Semiconductors,2010

2. NIST Fact Sheet;Advanced Measurement Laboratory,2004

3. NIST's new digs;Morrissey;Chem. Eng. News,2004

4. Workshop on measurement needs for local-structure determination in inorganic materials;Levin;J. Res. Natl. Inst. Stand. Technol.,2008

5. How to optimize the experimental design of quantitative atomic resolution TEM experiments?;Van Aert;Micron,2004

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