Surface blistering of ion irradiated SiC studied by grazing incidence electron microscopy
Author:
Publisher
Elsevier BV
Subject
Nuclear Energy and Engineering,General Materials Science,Nuclear and High Energy Physics
Reference10 articles.
1. Non-destructive structural analysis of surface blistering by TEM and EELS in a reflection configuration
2. In-situ observation of surface blistering in silicon by deuterium and helium ion irradiation
3. Helium desorption/permeation from bubbles in silicon: A novel method of void production
4. Radiation damage–He interaction in He implanted Si during bubble formation and their evolution in voids
5. Observation of Surface Blistering by Grazing Incidence Electron Microscopy
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