Oxidation characteristics of basal () plane and prism () plane in HCP Zr
Author:
Publisher
Elsevier BV
Subject
Nuclear Energy and Engineering,General Materials Science,Nuclear and High Energy Physics
Reference23 articles.
1. Transmission electron microscopy of thin (<2000 å) thermally formed ZrO2 films
2. Transmission and scanning electron microscopy of oxides anodically formed on zircaloy-2
3. A transmission electron diffraction study of ZrO2 on α-Zr (0001)
4. Electron diffraction analysis of ZrO2 on αZr(112̄0)
5. Electron diffraction from ZrO2 on αZr(101̄0)
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