Threshold voltage characteristics of ion-implanted depletion MOSFETs

Author:

Tarasewicz S.W.,Salama C.A.T.

Publisher

Elsevier BV

Subject

Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Cited by 4 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Rapid MOSFET threshold voltage testing for high throughput semiconductor process monitoring;2024 IEEE 36th International Conference on Microelectronic Test Structures (ICMTS);2024-04-15

2. Threshold voltage control in buried-channel MOSFETs;Solid-State Electronics;1997-09

3. Threshold Voltage;Computational Microelectronics;1993

4. A new description of dual γ-factor threshold voltage with continuous second-order derivative;Solid-State Electronics;1992-11

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