Author:
Allsopp D.W.E.,Peaker A.R.
Subject
Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Reference12 articles.
1. Inst. Phys. Conf. Ser. No. 45;Mandal,1979
2. Defect spatial distributions in annealed ion‐implanted silicon measured by a transient capacitance technique
3. Materials Research Soc. Symposium Proc. 2: Defects in Semiconductors;Wang,1981
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