Parasitic source and drain resistance in high-electron-mobility transistors
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Reference7 articles.
1. A New Field-Effect Transistor with Selectively Doped GaAs/n-AlxGa1-xAs Heterojunctions
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1. Electron Transport Mechanism for Ohmic Contact to GaN/AlGaN/GaN Heterostructure Field-Effect Transistors;IEEE Transactions on Electron Devices;2013-09
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3. Use of double-channel heterostructures to improve the access resistance and linearity in GaN-based HEMTs;IEEE Transactions on Electron Devices;2006-03
4. Dominant Noise Source of Low-Frequency Fluctuation in AlGaAs/InGaAs High Electron Mobility Transistors;Japanese Journal of Applied Physics;2003-04-30
5. Optimization of technological parameters of ohmic contact junctions for GaAs-AlGaAs-based transistor structures;Semiconductor Physics, Quantum Electronics and Optoelectronics;2002-06-25
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