Determination of surface state density in tunnel MOS devices from current-voltage characteristic
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Reference6 articles.
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3. CONDUCTING POLYMER-BASED SCHOTTKY BARRIER AND HETEROJUNCTION DIODES AND THEIR SENSOR APPLICATION;Handbook of Surfaces and Interfaces of Materials;2001
4. Current-voltage characteristics of Schottky barrier diodes with dynamic interfacial defect state occupancy;IEEE Transactions on Electron Devices;1996-07
5. The effect of shunt resistance on the electrical characteristics of Schottky barrier diodes;Journal of Physics D: Applied Physics;1996-03-14
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