Evidence that burst noise is a multi-step phenomenon
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Reference14 articles.
1. Noise in solid-state microstructures: A new perspective on individual defects, interface states and low-frequency (1/ƒ) noise
2. Localized-State Interactions in Metal-Oxide-Semiconductor Tunnel Diodes
3. Current fluctuations and silicon oxide wear‐out in metal‐oxide‐semiconductor tunnel diodes
4. Defect Interactions and Noise in Metallic Nanoconstrictions
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1. Burst noise in rechargeable LiFePO4 batteries and its changes after long-term calendar aging;Journal of Power Sources;2023-10
2. On the anomalous behavior of the relative amplitude of RTS noise;Solid-State Electronics;1998-06
3. Discrete conductance fluctuations in silicon emitter junctions due to defect clustering and evidence for structural changes by high‐energy electron irradiation and annealing;Journal of Applied Physics;1992-10
4. Statistical analysis of transients involved in moderate amplitude burst noise in bipolar junction transistors;Solid-State Electronics;1992-08
5. Study of sudden changes of large amplitude burst noise in bipolar transistors;Solid-State Electronics;1992-08
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