Surface recombination, free-carrier saturation, and dangling bonds in InP and GaAs
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Reference25 articles.
1. Evidence for low surface recombination velocity onn‐type InP
2. Hall Effect Measurements of Zn Implanted GaAs
3. Epitaxial growth of Cd‐doped InP from the vapor
4. Carrier Saturation in Tin‐Doped InP Films Grown by Liquid Phase Epitaxy
5. Indium Phosphide
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