Photo-accelerated MOS-C C−t transient measurements
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
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Cited by 4 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Physical understanding and technological control of carrier lifetimes in semiconductor materials and devices: A critique of conceptual development, state of the art and applications;Progress in Quantum Electronics;2005-01
2. Measurement time reduction for generation lifetimes;IEEE Transactions on Electron Devices;1999-05
3. Diamond MIS Capacitors with Silicon Dioxide Dielectric;Wide Band Gap Electronic Materials;1995
4. Optical characterization of diamond MIS capacitors;IEEE Transactions on Electron Devices;1994-07
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