Temperature-ramp resistance analysis to characterize electromigration-Reference-Cited by-同舟云学术

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Temperature-ramp resistance analysis to characterize electromigration

Published:1983-05 Issue:5 Volume:26 Page:445-452
ISSN:0038-1101
Container-title:Solid-State Electronics
language:en
Short-container-title:Solid-State Electronics

Author:

Pasco R.W.,Schwarz J.A.

Publisher

Elsevier BV

Subject

Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Reference20 articles.

1. Thin Films, Interdiffusion and Reactions;d'Heurle,1978

2. Electro- and Thermo-Transport in Metals and Alloys;Hummel,1977

3. Electro- and Thermo-Transport in Metals and Alloys;Ho,1977

4. Final Technical Report to Rome Air Development Center;Ghate;RADC-TR-80-328,1980

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