Shot noise in solid state diodes-Reference-Cited by-同舟云学术

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Shot noise in solid state diodes

Published:1986-10 Issue:10 Volume:29 Page:1069-1071
ISSN:0038-1101
Container-title:Solid-State Electronics
language:en
Short-container-title:Solid-State Electronics

Author:

van der Ziel Alder,Anderson James B.,Birbas Alexis N.,Chen Wei C.,Peng Fang ,Hietala Vincent M.,Park Chin Sup,Pukite Paul R.,Toups Michael F.,Xiaolan Wu ,Jingming Xu ,Young Alister C.

Publisher

Elsevier BV

Subject

Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Reference6 articles.

1. Fluctuation Phenomena in Semiconductors;van der Ziel,1959

Cited by 5 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Low-Frequency Noise Assessment for Deep Submicrometer CMOS Technology Nodes;Journal of The Electrochemical Society;2004

2. Noise Modeling;High-Frequency Bipolar Transistors;2003

3. On the geometry dependence of the 1/f noise in CMOS compatible junction diodes;IEEE Transactions on Electron Devices;1999

4. Noise of junction devices;Physical Review B;1988-10-15

5. Semiconductor noise;Physical Review B;1988-10-15

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