Trap states as an explanation for the Meyer–Neldel rule in semiconductors-Reference-Cited by-同舟云学术

Trap states as an explanation for the Meyer–Neldel rule in semiconductors

Published:2005-06 Issue:3 Volume:6 Page:137-141
ISSN:1566-1199
Container-title:Organic Electronics
language:en
Short-container-title:Organic Electronics

Author:

Stallinga P.,Gomes H.L.

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Materials Chemistry,Condensed Matter Physics,General Chemistry,Biomaterials,Electronic, Optical and Magnetic Materials

Reference17 articles.

1. A comparative study of the Meyer–Neldel rule in porous silicon and hydrogenated amorphous silicon

2. Observation of Meyer-Neldel rule in extended energy regime using novel a-Si:H TFTs

3. Investigations of the electron transport behavior in microcrystalline Si films

4. MeyerâNeldel rule and anti MeyerâNeldel rule of ionic conductivity Conclusions from the coupling model

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