A novel defect depth measurement method based on Nonlinear System Identification for pulsed thermographic inspection-Reference-Cited by-同舟云学术

A novel defect depth measurement method based on Nonlinear System Identification for pulsed thermographic inspection

Published:2017-02 Issue: Volume:85 Page:382-395
ISSN:0888-3270
Container-title:Mechanical Systems and Signal Processing
language:en
Short-container-title:Mechanical Systems and Signal Processing

Author:

Zhao Yifan,Mehnen Jörn,Sirikham Adisorn,Roy Rajkumar

Funder

EPSRC Centre

Publisher

Elsevier BV

Subject

Computer Science Applications,Mechanical Engineering,Aerospace Engineering,Civil and Structural Engineering,Signal Processing,Control and Systems Engineering

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4. Degradation assessment of industrial composites using thermography;Zhao;Proc. CIRP,2015

5. Defect sizing by transient thermography II. A numerical treatment;Saintey;J. Phys. D Appl. Phys.,1995

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