High performance raster scanning of atomic force microscopy using Model-free Repetitive Control-Reference-Cited by-同舟云学术

High performance raster scanning of atomic force microscopy using Model-free Repetitive Control

Published:2022-07 Issue: Volume:173 Page:109027
ISSN:0888-3270
Container-title:Mechanical Systems and Signal Processing
language:en
Short-container-title:Mechanical Systems and Signal Processing

Author:

Li Linlin^ORCID,Fleming Andrew J.,Yong Yuen K.,Aphale Sumeet S.,Zhu LiMin^ORCID

Publisher

Elsevier BV

Subject

Computer Science Applications,Mechanical Engineering,Aerospace Engineering,Civil and Structural Engineering,Signal Processing,Control and Systems Engineering

Reference41 articles.

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4. Improvement in the imaging performance of atomic force microscopy: A survey;Rana;IEEE Trans. Autom. Sci. Eng.,2017

5. Improvement of alternative non-raster scanning methods for high speed atomic force microscopy: A review;Das;IEEE Access,2019

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