Author:
Fouillat P.,Lapuyade H.,Maidon Y.,Dom J.P.
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference6 articles.
1. Latchup in CMOS technology;Troutman,1988
2. A practical high-latchup Immunity Design Methodology for Internal Circuits in the Standard Cell-based CMOS/BiCMOS LSI's;Aoki;IEEE Trans. Electron. Devices,1993
3. Investigation of surface-induced latch-up in VLSI CMOS using a laser beam;Quincke;Microelectronic Engineering,1987
4. Localisation and characterization of Latch-up sensitive areas using a laser beam: influence on design rules of ICs in CMOS technology;Fouillat;QREI,1993
5. Critical evaluation of the pulsed laser method for single event effects testing and fundamental studies;Melinger;IEEE Transactions on Nuclear Science,1994