VLSI testing with CAD-linked electron beam test system-Reference-Cited by-同舟云学术

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VLSI testing with CAD-linked electron beam test system

Published:1996-02 Issue:1-4 Volume:31 Page:319-330
ISSN:0167-9317
Container-title:Microelectronic Engineering
language:en
Short-container-title:Microelectronic Engineering

Author:

Nakamae Koji,Miura Katsuyoshi,Fujioka Hiromu

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference14 articles.

1. VLSI Design for Manufacturing: Yield Enhancement;Director,1990

2. Electron beam testing;Ura,1989

3. IDA: A tool for Computer-Aided Failure Analysis;Noble,1992

4. E-Beam Fault Diagnosis System for Logic VLSIs;Yamaguchi;Microelectronic Engineering,1992

5. Cone/Block Methods for Logic Simulation Time Reduction in E-Beam Guided-Probe Diagnosis;Kuji;IEICE Trans. Electron.,1994

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