High speed testing of conductor networks with electron beams-Reference-Cited by-同舟云学术

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High speed testing of conductor networks with electron beams

Published:1990-05 Issue:1-4 Volume:12 Page:241-251
ISSN:0167-9317
Container-title:Microelectronic Engineering
language:en
Short-container-title:Microelectronic Engineering

Author:

Pfeiffer Hans C.,Golladay Steven D.

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference9 articles.

1. Thermal Conduction Module: A High-Performance Multilayer Ceramic Package

2. A practical e-beam system for high speed continuity testing of conductor networks;Pfeiffer,1986

3. A tripotential method for electron beam testing;Hohn,1982

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Principles and Applications;Electron Beam Testing Technology;1993

2. Electron beam testing versus laser beam testing;Microelectronic Engineering;1992-03

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