Analytical techniques for localization and sensitivity analysis of latch-up in CMOS IC's-Reference-Cited by-同舟云学术

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Analytical techniques for localization and sensitivity analysis of latch-up in CMOS IC's

Published:1989-09 Issue:1 Volume:10 Page:11-39
ISSN:0167-9317
Container-title:Microelectronic Engineering
language:en
Short-container-title:Microelectronic Engineering

Author:

Muschitiello Michele,Corsi Francesco,Stucchi Michele,Zanoni Enrico,Canali Claudio

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference31 articles.

1. A perspective on CMOS technology trends;Holton,1986

2. The physics and modeling of latch-up in CMOS integrated circuits;Estreich,1980

3. Updating of CMOS reliability;Brambilla;Microelectronics and Reliability,1983

4. A method of detecting hot spots on semiconductors using liquid crystals;Hiatt,1981

5. Latch-up analysis of CMOS integrated circuits for automotive applications;Rocchelli;Alta Frequenza,1985

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