Simulation of heating in powerful electron lithography
Author:
Publisher
Elsevier BV
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference11 articles.
1. Abstract Book;Kawano,1993
2. Abstract Book;Pfeffer,1993
3. Abstract Book;Elsner,1993
4. Abstract Book;Shimazu,1993
5. Abstract Book;Sakamoto,1993
Cited by 5 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Current density and exposure sequence effect in electron lithography;SPIE Proceedings;2006-05-24
2. Simulation and measurement of resist heating in multipass exposure using a 50 kV variably shaped beam system;Microelectronic Engineering;1999-05
3. Software for eraure simul () in electron-beam lithography;Microelectronic Engineering;1998-03
4. Terahertz waveguide components fabricated using a 3D x-ray microfabrication technique;Electronics Letters;1996
5. Dose contribution of heating in electron-beam lithography;Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures;1995-11
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