Logic state analysis using a laser beam-Reference-Cited by-同舟云学术

Logic state analysis using a laser beam

Published:1992-03 Issue:1-4 Volume:16 Page:287-294
ISSN:0167-9317
Container-title:Microelectronic Engineering
language:en
Short-container-title:Microelectronic Engineering

Author:

Fouillat P.,Danto Y.,Dom J.P.

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference6 articles.

1. Design to test;Turino;Logical Solutions Technology,1989

2. Localization and charactherization of latchup sensitive areas using a laser beam : influence on design rules of IC's in CMOS technology;Fouillat;ESREF 90 - Bari (I),1990

3. HSPICE H8801 User's Manual;Meta-Software;Meta-Software,1988

4. Optical beam induced currents in MOS transistors;Fritz;Microelec. Engineering,1989

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