Bridging the gap between conventional and E-beam testing-Reference-Cited by-同舟云学术

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Bridging the gap between conventional and E-beam testing

Published:1992-03 Issue:1-4 Volume:16 Page:185-192
ISSN:0167-9317
Container-title:Microelectronic Engineering
language:en
Short-container-title:Microelectronic Engineering

Author:

Mucha Joachim

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference27 articles.

1. Gedankenexperiments on Sequential Machines. Automata Studies;Moore;Annals Math. Studies,1956

2. Logic Testing and Design for Testability;Fujiwara,1985

3. Logic Design Principles with Emphasis on Testable Semicustom Circuits;McCluskey,1986

4. Digital Systems Testing and Testable Design;Abramovici,1990

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Testability improvements using E-Beam controllability: Principle and design for Electron-Beam testability;Microelectronic Engineering;1996-02

2. Test generation with dynamic probe points in high observability testing environment;IEEE Transactions on Computers;1996

3. Implementation of laser beam sensitive cells: A new approach for integrated circuits testing;Quality and Reliability Engineering International;1994

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