Electron-beam testing of flat panel display substrates-Reference-Cited by-同舟云学术

Electron-beam testing of flat panel display substrates

Published:1994-03 Issue:1-4 Volume:24 Page:35-42
ISSN:0167-9317
Container-title:Microelectronic Engineering
language:en
Short-container-title:Microelectronic Engineering

Author:

Schmitt R.,Brunner M.,Winkler D.

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference5 articles.

1. The AM-LCD picture gets brighter;Liebermann;Electronic World News,1993

2. Flat-panel in-process test, repair, and inspection: An overview;Henley;Society for Information Display (SID) Digest,1992

3. In-process functional inspection technique for active-matrix LCD panels;Kido;Japan Display,1992

4. Testing TFT substrates with a transfer admittance method;Hall;Society for Information Display (SID) Digest,1991

5. Electron-beam MCM substrate tester;Brunner;IEEE Multi-Chip Module Conference MCMC,1993

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