Author:
Jäger D.,David G.,von Wendorff W.
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference25 articles.
1. Optical techniques for on-wafer measurements of MMICs;Lee;Microwave Journ.,1990
2. Probing the limits of traditional MMIC test equipement;Bloom;Microwaves & RF,1987
3. Electrooptic sampling measures MMICs with polarized light;Bloom;Microwaves & RF,1987
4. Picosecond optoelectronic switching and gating in silicon;Auston;Appl. Phys. Lett.,1975
5. Picosecond optoelectronic detection sampling, and correlation measurements in amorphous semiconductors;Auston;Appl. Phys. Lett.,1980
Cited by
4 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献