1. A Method for Taking Stereoscopic SEM Pictures by Eucentric Rotation in the Tilted Specimen Plane (at any degree of tilt);Blödorn;Scanning,1978
2. Reconstruction of True Surface-Topographies in Scanning Electron Microscopes Using Backscattered Electrons;Carlsen;Scanning,1985
3. Automatische Erzeugung dreidimensionaler Kantenmodelle aus mehreren zweidimensionalen Objektansichten;Helmke,1990
4. Multiple Detector Method for Quantitative Determination of Microtopography in the SEM;Lebiedzik;Scanning Electron Microscopy, Chicago,1975
5. Photogrammetric Self-Calibration of Scanning Electron Microscopes;Maune;Photogrammetric Engineering and Remote Sensing,1976