Author:
Skotnicki Tomasz,Merckel Gérard,Denat Christian
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference8 articles.
1. ESSDERC'87;Camerlenghi,1987
2. A.G. Sabnis, VLSI Reliability, in VLSI Electronics Microstructure Science series edited by N.G. Einspruch, Vol. 22, Academic Press, Inc.
3. n-channel MOSFET breakdown characteristics and modeling for p-well technologies
Cited by
1 articles.
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