Electronic structure evolution upon lithiation: A Li K-edge study of silicon oxide anode through X-ray Raman spectroscopy-Reference-Cited by-同舟云学术

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Electronic structure evolution upon lithiation: A Li K-edge study of silicon oxide anode through X-ray Raman spectroscopy

Published:2024-10 Issue: Volume:29 Page:100155
ISSN:2666-2485
Container-title:Journal of Power Sources Advances
language:en
Short-container-title:Journal of Power Sources Advances

Author:

Huang Hong-Jyun,Hsu Chia-Shuo,Huang Jin-Ya,Haw Shu-Chih,Chen Han-Yi,Hiraoka Nozomu,Liao Yen-Fa,Hu Chih-Wei^ORCID

Funder

National Chung-Shan Institute of Science and Technology

Publisher

Elsevier BV

Reference46 articles.

1. Recent advancement of SiOx based anodes for lithium-ion batteries;Chen;J. Power Sources,2017

2. Silicon oxides: a promising family of anode materials for lithium-ion batteries;Liu;Chem. Soc. Rev.,2019

3. Characterizations and electrochemical behaviors of disproportionated SiO and its composite for rechargeable Li-ion batteries;Park;J. Mater. Chem.,2010

4. Investigation of the irreversible reaction mechanism and the reactive trigger on SiO anode material for lithium-ion battery;Yamamura;J. Ceram. Soc. Jpn.,2011

5. Structural analysis of pure and electrochemically lithiated SiO using neutron elastic scattering;Nagao;J. Electrochem. Soc.,2004

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