1. On the use of linear sums in exhaustive testing, digest of papers;Akers,1985
2. Fault coverage of pseudo-exhaustive testing, digest of papers;Archambeau,1984
3. Exhaustive generation of bit patterns with applications to VLSI self-testing;Barzilai;IEEE Trans. Comput.,1983
4. The weighted syndrome sums approach to VLSI testing;Barzilai;IEEE Trans. Comput.,1981
5. Design of Testable Logic Circuits;Bennets,1984