Author:
Netanyahu Nathan S.,Weiss Isaac
Subject
Artificial Intelligence,Computer Vision and Pattern Recognition,Signal Processing,Software
Reference30 articles.
1. N.S. Netanyahu, I. Weiss, Analytic outlier removal for line fitting, Proceedings of the 12th IAPR International Conference on Pattern Recognition, Jerusalem, Israel, October 1994, pp. 406–408.
2. Direction-weighted line fitting to edge data;Rosenfeld;Pattern Recognition Lett.,1987
3. Line fitting in a noisy image;Weiss;IEEE Trans. Pattern Anal. Mach. Intell.,1989
4. A non-parametric method for fitting a straight line to a noisy image;Kamgar-Parsi;IEEE Trans. Pattern Anal. Mach. Intell.,1989
5. Robust regression methods for computer vision — a review;Meer;Int. J. Comput. Vision,1991
Cited by
4 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献