Hybrid statistics-simulations based method for atom-counting from ADF STEM images
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
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1. Atom counting based on Voronoi averaged STEM intensities using a crosstalk correction scheme;Ultramicroscopy;2024-02
2. Atom counting from a combination of two ADF STEM images;Ultramicroscopy;2024-01
3. Real-time simulations of ADF STEM probe position-integrated scattering cross-sections for single element fcc crystals in zone axis orientation using a densely connected neural network;Ultramicroscopy;2023-09
4. Fast generation of calculated ADF-EDX scattering cross-sections under channelling conditions;Ultramicroscopy;2023-04
5. Three Approaches for Representing the Statistical Uncertainty on Atom-Counting Results in Quantitative ADF STEM;Microscopy and Microanalysis;2023-01-14
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