On the role of the second-order derivative term in the calculation of convergent beam diffraction patterns-Reference-Cited by-同舟云学术

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On the role of the second-order derivative term in the calculation of convergent beam diffraction patterns

Published:2017-08 Issue: Volume:179 Page:73-80
ISSN:0304-3991
Container-title:Ultramicroscopy
language:en
Short-container-title:Ultramicroscopy

Author:

Hillier S.C.,Robertson E.T.,Reid G.D.,Haynes R.D.,Robertson M.D.

Funder

Natural Sciences and Engineering Research Council of Canada

Publisher

Elsevier BV

Subject

Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference30 articles.

1. Advanced Computing in Electron Microscopy;Kirkland,2010

2. Transmission Electron Microscopy;Williams,1996

3. The scattering of fast electrons by crystals;Humphreys;Rep. Prog. Phys.,1979

4. Introduction to Conventional Electron Microscopy;Graef,2003

5. Transmission Electron Microscopy - Physics of Image Formation and Microanalysis;Reimer,1993

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Theory of Calculation of Images of Thick Specimens;Advanced Computing in Electron Microscopy;2020

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