Contact atomic force microscopy using piezoresistive cantilevers in load force modulation mode-Reference-Cited by-同舟云学术

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Contact atomic force microscopy using piezoresistive cantilevers in load force modulation mode

Published:2018-01 Issue: Volume:184 Page:199-208
ISSN:0304-3991
Container-title:Ultramicroscopy
language:en
Short-container-title:Ultramicroscopy

Author:

Biczysko P.,Dzierka A.,Jóźwiak G.,Rudek M.,Gotszalk T.,Janus P.,Grabiec P.,Rangelow I.W.

Funder

European Union

Publisher

Elsevier BV

Subject

Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference31 articles.

1. A theoretical comparison between interferometric and optical beam deflection technique for the measurement of cantilever displacement in AFM;Putman;Ultramicroscopy,1992

2. An Comparison of force sensors for atomic force microscopy based on quartz tuning forks and length-extensional resonators;Giessibl;Phys. Rev. B,2011

3. Atomic resolution with an atomic force microscope using piezoresistive detection;Tortonese;Appl. Phys. Lett.,1993

4. Thermal nanoprobe;Rangelow;Microectron. Eng.,2001

5. Piezoresistive SXM sensors;Rangelow;Surf. Interface Anal.,2002

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